X-ray diffraction simulation of GeSn/Ge multi-quantum wells with kinematic approach

We report an investigation on X-ray diffraction simulation of GeSn/Ge Multi-quantum wells (MQWs) with kinematic approach. X-ray diffraction in (004) ω-2θ scan and (224) reciprocal space mapping are performed for characterization of the MQWs. However, simulation of the diffraction process is imperati...

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Veröffentlicht in:Journal of crystal growth 2017-06, Vol.468, p.272-274
Hauptverfasser: Li, Hui, Chang, Chiao, Cheng, Hung-Hsiang
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Sprache:eng
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