Hydride CVD Hetero-epitaxy of B^sub 12^P^sub 2^ on 4H-SiC
Icosahedral boron phosphide (B12P2) is a wide bandgap semiconductor (3.35 eV) that has been reported to "self-heal" from high-energy electron bombardment, making it attractive for potential use in radioisotope batteries, radiation detection, or in electronics in high radiation environments...
Gespeichert in:
Veröffentlicht in: | Journal of crystal growth 2017-02, Vol.459, p.112 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Icosahedral boron phosphide (B12P2) is a wide bandgap semiconductor (3.35 eV) that has been reported to "self-heal" from high-energy electron bombardment, making it attractive for potential use in radioisotope batteries, radiation detection, or in electronics in high radiation environments. This study focused on improving B12P2 hetero-epitaxial films by growing on 4H-SiC substrates over the temperature range of 1250-1450 °C using B2H6 and PH3 precursors in a H2 carrier gas. XRD scans and Laue transmission photographs revealed that the epitaxial relationship was ... The film morphology and crystallinity were investigated as a function of growth temperature and growth time. At 1250 °C, films tended to form rough, polycrystalline layers, but at 1300 and 1350 °C, films were continuous and comparatively smooth (RRMS ≤ 7 nm). At 1400 or 1450 °C, the films grew in islands that coalesced as the films became thicker. Using XRD rocking curves to evaluate the crystal quality, 1300 °C was the optimum growth temperature tested. At 1300 °C, the rocking curve FWHM decreased with increasing film thickness from 1494 arcsec for a 1.1 µm thick film to 954 arcsec for a 2.7 µm thick film, suggesting a reduction in defects with thickness.(ProQuest: ... denotes formulae/symbols omitted.) |
---|---|
ISSN: | 0022-0248 1873-5002 |