Coercive force and magnetization reversal of Co—P Films obtained by chemical deposition

Results from studying three-layer films with magnetic layers produced on the basis of the Co—P compound and a nonmagnetic Ni—P layer are presented. It is shown that the features of the magnetization reversal of the film are due to the kinetics of the formation of the crystalline structure of the hard magnetic layer. It is established that at low thickness, this layer consists of separate grains of the crystalline phase. With an increase in thickness, this layer transitions to the homogeneous polycrystalline state. These results allow us to explain the anomalous change of the coercive force and the displacement field of the soft magnetic layer depending on the thickness of the hard magnetic layer.