Accuracy characteristics for quantum process tomography using superconductor phase qubits

A method for the precision statistical control of quantum processes is developed on the basis of applications of superconductor phase qubits. A detailed analysis of tomographic accuracy for a 2-qubit SQiSW gate arising due to capacitive coupling between qubits is performed by means of universal quan...

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Veröffentlicht in:Bulletin of the Russian Academy of Sciences. Physics 2012-02, Vol.76 (2), p.139-142
Hauptverfasser: Bogdanov, Yu. I., Nuyanzin, S. A.
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Nuyanzin, S. A.
description A method for the precision statistical control of quantum processes is developed on the basis of applications of superconductor phase qubits. A detailed analysis of tomographic accuracy for a 2-qubit SQiSW gate arising due to capacitive coupling between qubits is performed by means of universal quantum tomography. The presented approach can be used to solve problems of quality and efficiency in superconductor quantum information technologies.
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subjects Hadrons
Heavy Ions
Nuclear Physics
Physics
Physics and Astronomy
Proceedings of the International Symposium “Nanophysics and Nanoelectronics-2011”
Quantum phenomena
Quantum theory
Qubits (quantum computing)
Superconductors
Tomography
title Accuracy characteristics for quantum process tomography using superconductor phase qubits
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