Accuracy characteristics for quantum process tomography using superconductor phase qubits

A method for the precision statistical control of quantum processes is developed on the basis of applications of superconductor phase qubits. A detailed analysis of tomographic accuracy for a 2-qubit SQiSW gate arising due to capacitive coupling between qubits is performed by means of universal quan...

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Veröffentlicht in:Bulletin of the Russian Academy of Sciences. Physics 2012-02, Vol.76 (2), p.139-142
Hauptverfasser: Bogdanov, Yu. I., Nuyanzin, S. A.
Format: Artikel
Sprache:eng
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Zusammenfassung:A method for the precision statistical control of quantum processes is developed on the basis of applications of superconductor phase qubits. A detailed analysis of tomographic accuracy for a 2-qubit SQiSW gate arising due to capacitive coupling between qubits is performed by means of universal quantum tomography. The presented approach can be used to solve problems of quality and efficiency in superconductor quantum information technologies.
ISSN:1062-8738
1934-9432
DOI:10.3103/S1062873812020049