Functional testing of digital signal processors in radiation experiments

Functional testing of digital signal processors in radiation experiments

This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to d...

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Veröffentlicht in:Russian microelectronics 2017-05, Vol.46 (3), p.171-179
Hauptverfasser: Marfin, V. A., Nekrasov, P. V., Kalashnikov, O. A., Nikiforov, A. Yu
Format: Artikel
Sprache:eng
Schlagworte:
Digital signal processors
Electrical Engineering
Engineering
Failure
Functional testing
Hardware
Processors
Radiation effects
Signal processing
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Beschreibung
Zusammenfassung:This paper analyzes the specifics of digital signal processors’ (DSPs) radiation-induced failures. The general methodology, as well as the hardware and software, for the functional testing (FT) of DSPs in radiation experiments is developed and implemented. The experimental results are presented to demonstrate the effectiveness of the solutions proposed.
ISSN:1063-7397
1608-3415
DOI:10.1134/S1063739717030052