X-ray diffraction, vibrational properties, and dielectric studies of 3-ammoniumpropyl imidazolium pentabromoantimonate (III)
A new organic–inorganic material 3-ammoniumpropyl imidazolium pentabromoantimonate (III) was reported. The title compound was synthesized at room temperature by slow evaporation and then characterized by single-crystal and powder X-ray diffraction, spectroscopic measurements, thermal analysis, and d...
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Veröffentlicht in: | Applied physics. A, Materials science & processing Materials science & processing, 2017-04, Vol.123 (4), p.1-10, Article 285 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | A new organic–inorganic material 3-ammoniumpropyl imidazolium pentabromoantimonate (III) was reported. The title compound was synthesized at room temperature by slow evaporation and then characterized by single-crystal and powder X-ray diffraction, spectroscopic measurements, thermal analysis, and dielectric technique. It crystallizes in the non-centrosymmetric space group P2
1
2
1
2
1
with the following unit cell parameters:
a
= 8.7120(7),
b
= 12.6608(1),
c
= 14.3498(1) Å with
Z
= 4. The crystal is built up of separated SbBr
5
2−
polyhedra anions and 3-ammoniumpropyl imidazolium cations. The cohesion of the structure is ensured by network of N–H…Br hydrogen bonds between the 3-ammoniumpropyl imidazolium cations and [SbBr
5
]
2−
anions, in which they may be effective in the stabilization of the crystal structure. The Raman and infrared spectra confirm the presence of both cationic [C
6
H
13
N
3
]
2+
and anionic [SbBr
5
]
2−
entities. Dielectric data were analyzed using complex permittivity
ε
* and complex electrical modulus
M
* for the sample at various temperatures. The conductivity follows the Arrhenius low. The
Z
′ and
Z
ʺ versus frequency plots are well fitted to an equivalent circuit model. The circuits consist of the parallel combination of bulk resistance Rp and constant phase elements CPE. [C
6
H
13
N
3
]SbBr
5
crystals undergo one endothermic peak at 333 K. This transition was detected by DSC and by dielectric measurements using the impedance and modulus spectroscopy techniques. |
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ISSN: | 0947-8396 1432-0630 |
DOI: | 10.1007/s00339-017-0895-4 |