On a defect identification method based on monitoring the structure and peculiarities of surface wave fields

On a defect identification method based on monitoring the structure and peculiarities of surface wave fields

A special technique is proposed for processing detected signals. The technique uses an adjustable orthonormal basis and makes it possible to effectively identify defects by monitoring the structure and peculiarities of surface wave fields.

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Veröffentlicht in:Russian journal of nondestructive testing 2016-07, Vol.52 (7), p.377-382
Hauptverfasser: Bocharova, O. V., Sedov, A. V., Andzhikovich, I. E., Kalinchuk, V. V.
Format: Artikel
Sprache:eng
Schlagworte:
Acoustic Methods
Characterization and Evaluation of Materials
Chemistry and Materials Science
Identification methods
Materials Science
Structural Materials
Surface waves
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Zusammenfassung:A special technique is proposed for processing detected signals. The technique uses an adjustable orthonormal basis and makes it possible to effectively identify defects by monitoring the structure and peculiarities of surface wave fields.
ISSN:1061-8309
1608-3385
DOI:10.1134/S1061830916070020