Method of investigation of galvanomagnetic properties of Cd x Hg1 − x Te and Cd x Hg1 − x Te/Cd1 − y Zn y Te
The galvanomagnetic Van der Pau measurements are carried out on single-crystalline CdxHg1−xTe (MCT) bulk samples and CdxHg1 − xTe/Cd1 − yZnyTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field t...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2016-12, Vol.50 (13), p.1716-1719 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The galvanomagnetic Van der Pau measurements are carried out on single-crystalline CdxHg1−xTe (MCT) bulk samples and CdxHg1 − xTe/Cd1 − yZnyTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field through the angle from 0° to 360° with the step of 6°. It is shown that the angular dependences of the voltage under measurement are sinusoidal for the p-MCT bulk sample at the temperatures of 77 K; i.e., the Hall coefficient is independent of the magnetic-field induction. However, the angular dependences of the measured signal appreciably differ from sinusoids for the MCT/CZT epitaxial heterostructures at the temperature of 77 K. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782616130030 |