Method of investigation of galvanomagnetic properties of Cd x Hg1 − x Te and Cd x Hg1 − x Te/Cd1 − y Zn y Te

The galvanomagnetic Van der Pau measurements are carried out on single-crystalline CdxHg1−xTe (MCT) bulk samples and CdxHg1 − xTe/Cd1 − yZnyTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field t...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2016-12, Vol.50 (13), p.1716-1719
Hauptverfasser: Golubyatnikov, V. A., Lysenko, A. P., Belov, A. G., Kanevskii, V. E.
Format: Artikel
Sprache:eng
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Zusammenfassung:The galvanomagnetic Van der Pau measurements are carried out on single-crystalline CdxHg1−xTe (MCT) bulk samples and CdxHg1 − xTe/Cd1 − yZnyTe (MCT/CZT) (x ≈ 0.2) epitaxial heterostructures at the temperature of 295 and 77 K. The sample rotates together with the cryostat in the electromagnet field through the angle from 0° to 360° with the step of 6°. It is shown that the angular dependences of the voltage under measurement are sinusoidal for the p-MCT bulk sample at the temperatures of 77 K; i.e., the Hall coefficient is independent of the magnetic-field induction. However, the angular dependences of the measured signal appreciably differ from sinusoids for the MCT/CZT epitaxial heterostructures at the temperature of 77 K.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782616130030