Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.41-42
Hauptverfasser: Ulfig, R.M., Prosa, T.J., Lenz, D.R, Payne, T.R.
Format: Artikel
Sprache:eng
Schlagworte:
A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Analytical and Instrumentation Science Symposia
Microscopy
Tomography
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 42
container_issue S3
container_start_page 41
container_title Microscopy and microanalysis
container_volume 21
creator Ulfig, R.M.
Prosa, T.J.
Lenz, D.R
Payne, T.R.
description
doi_str_mv 10.1017/S1431927615001002
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1871738008</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927615001002</cupid><sourcerecordid>4317038901</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</originalsourceid><addsrcrecordid>eNp1UE1Lw0AQXUTBWv0B3hY8x85ks7vTi1Bqq4WCtX7gLazJpqY0Td1NhP57t7YHQTzN8OZ9DI-xS4RrBNS9J0wE9mOtUAIgQHzEOgGSESHK458do939lJ15vwQAAVp12M2taQx_bM2qbLZ8Um1c_WUru248L9e8-bD8tV41ZmGjWbvyNufT0WDGQwbwee9tfs5OChPwi8Psspfx6Hl4H00f7ibDwTTKYpBxpHMhikxplLJITELKkhKqnyWkZSYzJWRBgpQhUKAzkloksSaRq4TyGMmILrva-4b_Plvrm3RZt24dIlMkjVoQAAUW7lmZq713tkg3rqyM26YI6a6m9E9NQSMOGlO9uzJf2F_W_6q-ASM1ZD4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1871738008</pqid></control><display><type>article</type><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><source>Cambridge University Press Journals Complete</source><creator>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</creator><creatorcontrib>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927615001002</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>A13 Advancing Data Collection and Analysis for Atom Probe Tomography ; Analytical and Instrumentation Science Symposia ; Microscopy ; Tomography</subject><ispartof>Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.41-42</ispartof><rights>Copyright © Microscopy Society of America 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</citedby><cites>FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927615001002/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Ulfig, R.M.</creatorcontrib><creatorcontrib>Prosa, T.J.</creatorcontrib><creatorcontrib>Lenz, D.R</creatorcontrib><creatorcontrib>Payne, T.R.</creatorcontrib><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>A13 Advancing Data Collection and Analysis for Atom Probe Tomography</subject><subject>Analytical and Instrumentation Science Symposia</subject><subject>Microscopy</subject><subject>Tomography</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UE1Lw0AQXUTBWv0B3hY8x85ks7vTi1Bqq4WCtX7gLazJpqY0Td1NhP57t7YHQTzN8OZ9DI-xS4RrBNS9J0wE9mOtUAIgQHzEOgGSESHK458do939lJ15vwQAAVp12M2taQx_bM2qbLZ8Um1c_WUru248L9e8-bD8tV41ZmGjWbvyNufT0WDGQwbwee9tfs5OChPwi8Psspfx6Hl4H00f7ibDwTTKYpBxpHMhikxplLJITELKkhKqnyWkZSYzJWRBgpQhUKAzkloksSaRq4TyGMmILrva-4b_Plvrm3RZt24dIlMkjVoQAAUW7lmZq713tkg3rqyM26YI6a6m9E9NQSMOGlO9uzJf2F_W_6q-ASM1ZD4</recordid><startdate>201508</startdate><enddate>201508</enddate><creator>Ulfig, R.M.</creator><creator>Prosa, T.J.</creator><creator>Lenz, D.R</creator><creator>Payne, T.R.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201508</creationdate><title>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</title><author>Ulfig, R.M. ; Prosa, T.J. ; Lenz, D.R ; Payne, T.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2052-7d33fc67155f4a486e86369c4875c5c635f8386a80607c857342783d648d218a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>A13 Advancing Data Collection and Analysis for Atom Probe Tomography</topic><topic>Analytical and Instrumentation Science Symposia</topic><topic>Microscopy</topic><topic>Tomography</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ulfig, R.M.</creatorcontrib><creatorcontrib>Prosa, T.J.</creatorcontrib><creatorcontrib>Lenz, D.R</creatorcontrib><creatorcontrib>Payne, T.R.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Proquest Nursing &amp; Allied Health Source</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ulfig, R.M.</au><au>Prosa, T.J.</au><au>Lenz, D.R</au><au>Payne, T.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2015-08</date><risdate>2015</risdate><volume>21</volume><issue>S3</issue><spage>41</spage><epage>42</epage><pages>41-42</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927615001002</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.41-42
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_1871738008
source Cambridge University Press Journals Complete
subjects A13 Advancing Data Collection and Analysis for Atom Probe Tomography
Analytical and Instrumentation Science Symposia
Microscopy
Tomography
title Data Quality Improvements in the Voltage-Pulsed LEAP 5000 R/XR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-06T18%3A39%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Data%20Quality%20Improvements%20in%20the%20Voltage-Pulsed%20LEAP%205000%20R/XR&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Ulfig,%20R.M.&rft.date=2015-08&rft.volume=21&rft.issue=S3&rft.spage=41&rft.epage=42&rft.pages=41-42&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927615001002&rft_dat=%3Cproquest_cross%3E4317038901%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1871738008&rft_id=info:pmid/&rft_cupid=10_1017_S1431927615001002&rfr_iscdi=true