Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
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| Veröffentlicht in: | Microscopy and microanalysis 2016-07, Vol.22 (S3), p.512-513 |
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| creator | Simson, M. Dunin-Borkowski, R.E. Hartmann, R. Huth, M. Ihle, S. Jones, L. Kondo, Y. Migunov, V. Nellist, P.D. Ritz, R. Ryll, H. Sagawa, R. Schmidt, J. Soltau, H. Strüder, L. Yang, H. |
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| doi_str_mv | 10.1017/S143192761600341X |
| format | Article |
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| ispartof | Microscopy and microanalysis, 2016-07, Vol.22 (S3), p.512-513 |
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| language | eng |
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| source | Alma/SFX Local Collection |
| subjects | Advanced Scanning Diffraction: Mapping Functionality in Reciprocal Space at Nanometer Resolution Analytical and Instrumentation Science Symposia Cameras Microscopy Radiation Tomography |
| title | Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM |
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