Extrinsic effects on microwave dielectric properties of high-Q MgZrTa2O8 ceramics

MgZrTa 2 O 8 ceramics with excellent microwave dielectric properties had been prepared through conventional mixed oxide route. All the sintered samples exhibited a single phase with wolframite structure type belonged to P2/c ( C 2h 4 ) space group. The Raman spectrum revealed a similar lattice vibra...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2016-11, Vol.27 (11), p.11325-11330
Hauptverfasser: Xia, Wang-Suo, Zhang, Lan-Yang, Wang, Ying, Jin, Shao-En, Xu, Yu-Pei, Zuo, Ze-Wen, Shi, Li-Wei
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Sprache:eng
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Zusammenfassung:MgZrTa 2 O 8 ceramics with excellent microwave dielectric properties had been prepared through conventional mixed oxide route. All the sintered samples exhibited a single phase with wolframite structure type belonged to P2/c ( C 2h 4 ) space group. The Raman spectrum revealed a similar lattice vibration in all samples with different sintering temperature. Emphatically, the extrinsic effects on microwave dielectric properties had also been investigated. The microwave dielectric properties of MgZrTa 2 O 8 ceramics presented a significant dependence on the sintering condition. The porosity-corrected permittivity (ε-pc) was calculated to investigate the influence of the porosity to the dielectric constant (ε r ). For the high-dense MgZrTa 2 O 8 ceramics, the main factors which had influences on quality factors (Q ×  f ) were the grain size and grain-size distribution. The temperature coefficient of resonant frequency (τ f ) was depended on the dielectric constant and pores. The typical microwave dielectric properties of MgZrTa 2 O 8 ceramics were ε r  = 22.76, Q ×  f  = 131,500 GHz, τ f  = −33.81 ppm/°C, sintered at 1475 °C.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-016-5256-0