Extrinsic effects on microwave dielectric properties of high-Q MgZrTa2O8 ceramics
MgZrTa 2 O 8 ceramics with excellent microwave dielectric properties had been prepared through conventional mixed oxide route. All the sintered samples exhibited a single phase with wolframite structure type belonged to P2/c ( C 2h 4 ) space group. The Raman spectrum revealed a similar lattice vibra...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2016-11, Vol.27 (11), p.11325-11330 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | MgZrTa
2
O
8
ceramics with excellent microwave dielectric properties had been prepared through conventional mixed oxide route. All the sintered samples exhibited a single phase with wolframite structure type belonged to
P2/c
(
C
2h
4
) space group. The Raman spectrum revealed a similar lattice vibration in all samples with different sintering temperature. Emphatically, the extrinsic effects on microwave dielectric properties had also been investigated. The microwave dielectric properties of MgZrTa
2
O
8
ceramics presented a significant dependence on the sintering condition. The porosity-corrected permittivity (ε-pc) was calculated to investigate the influence of the porosity to the dielectric constant (ε
r
). For the high-dense MgZrTa
2
O
8
ceramics, the main factors which had influences on quality factors (Q ×
f
) were the grain size and grain-size distribution. The temperature coefficient of resonant frequency (τ
f
) was depended on the dielectric constant and pores. The typical microwave dielectric properties of MgZrTa
2
O
8
ceramics were ε
r
= 22.76, Q ×
f
= 131,500 GHz, τ
f
= −33.81 ppm/°C, sintered at 1475 °C. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-016-5256-0 |