Investigation Of Helium Implanted Fe–Cr Alloys By Means Of X–Ray Diffraction And Positron Annihilation Spectroscopy
X-ray diffraction (XRD) and positron annihilation spectroscopy (PAS) have been used for the characterization of the two binary alloys Fe-Cr with Cr content 2.36 and 8.39 wt%. The influence of ion implantation on these alloys was studied. Different implantation doses of helium, up to 0.5 C/cm , were...
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Veröffentlicht in: | Journal of Electrical Engineering 2015-11, Vol.66 (6), p.334-338 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | X-ray diffraction (XRD) and positron annihilation spectroscopy (PAS) have been used for the characterization of the two binary alloys Fe-Cr with Cr content 2.36 and 8.39 wt%. The influence of ion implantation on these alloys was studied. Different implantation doses of helium, up to 0.5 C/cm
, were used to simulate neutron-induced damage in a sub-surface region. To characterize the damage, a lattice parameter, coherent domain size, residual stress and a crystallographic texture have been studied by grazing incidence X-ray diffraction (GIXRD). It was found out that these parameters showed a similar dependence on the implantation dose as the positron lifetime determined by positron annihilation spectroscopy. |
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ISSN: | 1339-309X 1335-3632 1339-309X |
DOI: | 10.2478/jee-2015-0055 |