A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images

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Veröffentlicht in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.984-985
Hauptverfasser: Curtin, A. E., Skinner, R., Sanders, A.W.
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Sprache:eng
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Advances in Instrumentation Symposia
Correlative Microscopy and Microanalysis from Macro to Pico
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container_issue S3
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container_title Microscopy and microanalysis
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creator Curtin, A. E.
Skinner, R.
Sanders, A.W.
description
doi_str_mv 10.1017/S1431927614006643
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subjects Advances in Instrumentation Symposia
Correlative Microscopy and Microanalysis from Macro to Pico
title A Simplified Approach to Determining Resolution of Optical, Ion and Electron Microscope Images
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