Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl
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| Veröffentlicht in: | Microscopy and microanalysis 2014-08, Vol.20 (S3), p.334-335 |
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| container_title | Microscopy and microanalysis |
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| creator | Kopeček, J. Jurek, K. Kopecký, V. Klimša, L. Seiner, H. Sedlák, P. Landa, M. Dluhoš, J. Petrenec, M. Hladík, L. Doupal, A. Heczko, O. |
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| doi_str_mv | 10.1017/S1431927614003390 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1855656467</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927614003390</cupid><sourcerecordid>4293937521</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2270-dfd7456b3f2c702761c54bc919c8cdf6e9af65b192341320edc6eda483da65423</originalsourceid><addsrcrecordid>eNp1kE1LAzEQhoMoWKs_wFvA82qy-do91sVqodZDK3iRJZuPNmV3U5NW6L83tR4E8TTDzPPOzDsAXGN0ixEWd3NMCS5zwTFFiJASnYBBKrGswJidfuc4O_TPwUWMa5QgJPgAvL-Z3vdw7NUuGg0nKb83soOuh9uVgfOV3Bj4bDof9nDUtn4f4aT_NHHrlnLrEp3BReIqGQ30Fs7cwkHZa1j5mRu1l-DMyjaaq584BK_jh0X1lE1fHifVaJqpPBco01YLynhDbK4EOphQjDaqxKUqlLbclNJy1iR_hGKSI6MVN1rSgmjJGc3JENwc526C_9il6-q134U-raxxwRhnnHKRKHykVPAxBmPrTXCdDPsao_rwxfrPF5OG_Ghk1wSnl-bX6H9VX_8ccV4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1855656467</pqid></control><display><type>article</type><title>Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl</title><source>Cambridge University Press Journals Complete</source><creator>Kopeček, J. ; Jurek, K. ; Kopecký, V. ; Klimša, L. ; Seiner, H. ; Sedlák, P. ; Landa, M. ; Dluhoš, J. ; Petrenec, M. ; Hladík, L. ; Doupal, A. ; Heczko, O.</creator><creatorcontrib>Kopeček, J. ; Jurek, K. ; Kopecký, V. ; Klimša, L. ; Seiner, H. ; Sedlák, P. ; Landa, M. ; Dluhoš, J. ; Petrenec, M. ; Hladík, L. ; Doupal, A. ; Heczko, O.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927614003390</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>15 Years of Focused Ion Beams at M & M ; Advances in Instrumentation Symposia ; Xenon</subject><ispartof>Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.334-335</ispartof><rights>Copyright © Microscopy Society of America 2014</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927614003390/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Kopeček, J.</creatorcontrib><creatorcontrib>Jurek, K.</creatorcontrib><creatorcontrib>Kopecký, V.</creatorcontrib><creatorcontrib>Klimša, L.</creatorcontrib><creatorcontrib>Seiner, H.</creatorcontrib><creatorcontrib>Sedlák, P.</creatorcontrib><creatorcontrib>Landa, M.</creatorcontrib><creatorcontrib>Dluhoš, J.</creatorcontrib><creatorcontrib>Petrenec, M.</creatorcontrib><creatorcontrib>Hladík, L.</creatorcontrib><creatorcontrib>Doupal, A.</creatorcontrib><creatorcontrib>Heczko, O.</creatorcontrib><title>Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>15 Years of Focused Ion Beams at M & M</subject><subject>Advances in Instrumentation Symposia</subject><subject>Xenon</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kE1LAzEQhoMoWKs_wFvA82qy-do91sVqodZDK3iRJZuPNmV3U5NW6L83tR4E8TTDzPPOzDsAXGN0ixEWd3NMCS5zwTFFiJASnYBBKrGswJidfuc4O_TPwUWMa5QgJPgAvL-Z3vdw7NUuGg0nKb83soOuh9uVgfOV3Bj4bDof9nDUtn4f4aT_NHHrlnLrEp3BReIqGQ30Fs7cwkHZa1j5mRu1l-DMyjaaq584BK_jh0X1lE1fHifVaJqpPBco01YLynhDbK4EOphQjDaqxKUqlLbclNJy1iR_hGKSI6MVN1rSgmjJGc3JENwc526C_9il6-q134U-raxxwRhnnHKRKHykVPAxBmPrTXCdDPsao_rwxfrPF5OG_Ghk1wSnl-bX6H9VX_8ccV4</recordid><startdate>201408</startdate><enddate>201408</enddate><creator>Kopeček, J.</creator><creator>Jurek, K.</creator><creator>Kopecký, V.</creator><creator>Klimša, L.</creator><creator>Seiner, H.</creator><creator>Sedlák, P.</creator><creator>Landa, M.</creator><creator>Dluhoš, J.</creator><creator>Petrenec, M.</creator><creator>Hladík, L.</creator><creator>Doupal, A.</creator><creator>Heczko, O.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201408</creationdate><title>Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl</title><author>Kopeček, J. ; Jurek, K. ; Kopecký, V. ; Klimša, L. ; Seiner, H. ; Sedlák, P. ; Landa, M. ; Dluhoš, J. ; Petrenec, M. ; Hladík, L. ; Doupal, A. ; Heczko, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2270-dfd7456b3f2c702761c54bc919c8cdf6e9af65b192341320edc6eda483da65423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>15 Years of Focused Ion Beams at M & M</topic><topic>Advances in Instrumentation Symposia</topic><topic>Xenon</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kopeček, J.</creatorcontrib><creatorcontrib>Jurek, K.</creatorcontrib><creatorcontrib>Kopecký, V.</creatorcontrib><creatorcontrib>Klimša, L.</creatorcontrib><creatorcontrib>Seiner, H.</creatorcontrib><creatorcontrib>Sedlák, P.</creatorcontrib><creatorcontrib>Landa, M.</creatorcontrib><creatorcontrib>Dluhoš, J.</creatorcontrib><creatorcontrib>Petrenec, M.</creatorcontrib><creatorcontrib>Hladík, L.</creatorcontrib><creatorcontrib>Doupal, A.</creatorcontrib><creatorcontrib>Heczko, O.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing & Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Nursing & Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing & Allied Health Premium</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kopeček, J.</au><au>Jurek, K.</au><au>Kopecký, V.</au><au>Klimša, L.</au><au>Seiner, H.</au><au>Sedlák, P.</au><au>Landa, M.</au><au>Dluhoš, J.</au><au>Petrenec, M.</au><au>Hladík, L.</au><au>Doupal, A.</au><au>Heczko, O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2014-08</date><risdate>2014</risdate><volume>20</volume><issue>S3</issue><spage>334</spage><epage>335</epage><pages>334-335</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927614003390</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record> |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.334-335 |
| issn | 1431-9276 1435-8115 |
| language | eng |
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| source | Cambridge University Press Journals Complete |
| subjects | 15 Years of Focused Ion Beams at M & M Advances in Instrumentation Symposia Xenon |
| title | Xenon Focused Ion Beam in the Shape Memory Alloys Investigation - The Case of NiTi and CoNiAl |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T08%3A32%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Xenon%20Focused%20Ion%20Beam%20in%20the%20Shape%20Memory%20Alloys%20Investigation%20-%20The%20Case%20of%20NiTi%20and%20CoNiAl&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Kope%C4%8Dek,%20J.&rft.date=2014-08&rft.volume=20&rft.issue=S3&rft.spage=334&rft.epage=335&rft.pages=334-335&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927614003390&rft_dat=%3Cproquest_cross%3E4293937521%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1855656467&rft_id=info:pmid/&rft_cupid=10_1017_S1431927614003390&rfr_iscdi=true |