Proton-Induced Single-Event Degradation in SDRAMs

Proton-Induced Single-Event Degradation in SDRAMs

Retention time and cell functionality degradation under proton irradiation is studied for SDRAM references that exhibit in-flight faulty behavior on satellites. Proton irradiation, with an adapted test protocol, allows to reproduce these effects and to gain a valuable insight on this phenomenon. Dat...

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Veröffentlicht in:IEEE transactions on nuclear science 2016-08, Vol.63 (4), p.2115-2121
Hauptverfasser: Rodriguez, Axel, Wrobel, Frederic, Samaras, Anne, Bezerra, Francoise, Vandevelde, Benjamin, Ecoffet, Robert, Touboul, Antoine, Chatry, Nathalie, Dilillo, Luigi, Saigne, Frederic
Format: Artikel
Sprache:eng
Schlagworte:
Degradation
Engineering Sciences
Graphical user interfaces
Neutrons
Nuclear Experiment
Physics
Proton
Protons
Radiation effects
retention time degradation
SDRAM
Time measurement
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Beschreibung
Zusammenfassung:Retention time and cell functionality degradation under proton irradiation is studied for SDRAM references that exhibit in-flight faulty behavior on satellites. Proton irradiation, with an adapted test protocol, allows to reproduce these effects and to gain a valuable insight on this phenomenon. Data acquired allow for a physical interpretation of the degradation, which results of one or more damage clusters created by a single particle.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2016.2551733