An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution
An FPGA-based instrument with capabilities of on-board oscilloscope and nanoscale pulsing (70 ns @ ±10 V) is presented, thus allowing exploration of the nano-scale switching of RRAM devices. The system possesses less than 1% read-out error for resistance range between 1 kΩ to 1 MΩ, and demonstrated...
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| Veröffentlicht in: | IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2016-06, Vol.63 (6), p.818-826 |
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| container_title | IEEE transactions on circuits and systems. I, Regular papers |
| container_volume | 63 |
| creator | Jinling Xing Serb, Alexander Khiat, Ali Berdan, Radu Hui Xu Prodromakis, Themistoklis |
| description | An FPGA-based instrument with capabilities of on-board oscilloscope and nanoscale pulsing (70 ns @ ±10 V) is presented, thus allowing exploration of the nano-scale switching of RRAM devices. The system possesses less than 1% read-out error for resistance range between 1 kΩ to 1 MΩ, and demonstrated its functionality on characterizing solid-state prototype RRAM devices on wafer; devices exhibiting gradual switching behavior under pulsing with duration spanning between 30 ns to 100 μs. The data conversion error-induced degradation on read-out accuracy is studied extensively and verified by standard linear resistor measurements. The integrated oscilloscope capability extends the versatility of our instrument, rendering a powerful tool for processing development of emerging memory technologies but also for testing theoretical hypotheses arising in the new field of memristors. |
| doi_str_mv | 10.1109/TCSI.2016.2538039 |
| format | Article |
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The integrated oscilloscope capability extends the versatility of our instrument, rendering a powerful tool for processing development of emerging memory technologies but also for testing theoretical hypotheses arising in the new field of memristors.</description><subject>Arrays</subject><subject>Crossbar</subject><subject>Data conversion</subject><subject>Degradation</subject><subject>Devices</subject><subject>FPGA</subject><subject>memristor array</subject><subject>Memristors</subject><subject>Nanostructure</subject><subject>Oscilloscopes</subject><subject>Rendering</subject><subject>Resistance</subject><subject>Resistors</subject><subject>RRAM</subject><subject>Switches</subject><subject>Switching</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkDFPwzAQhSMEEqXwAxCLJRaWlHMcO84YorZUakVVCoyRm1xoqtQpdjLAr8dRKwaWu5Pue6d3z_NuKYwohfhxnb7ORgFQMQo4k8DiM29AOZc-SBDn_RzGvmSBvPSurN0BBDEwOvDeE00my2niPymLBZlp25puj7olZWPIWPsLZS2S1SpZkHSrjMpbNNWPaqtGk4-q3RJtybKrbaU_yQptU3f96tq7KFVt8ebUh97bZLxOn_35y3SWJnM_ZyJufSmpYJIip8iwYCwo0NkK81BEoCIpoHAfRW7KAYCXm6iEvEAVB5EKNywENvQejncPpvnq0LbZvrI51rXS2HQ2o5JxwbkrDr3_h-6azmjnzlHAKaNxKB1Fj1RuGmsNltnBVHtlvjMKWZ901ied9Ulnp6Sd5u6oqRDxj4_CCEQQsl9xfHdW</recordid><startdate>201606</startdate><enddate>201606</enddate><creator>Jinling Xing</creator><creator>Serb, Alexander</creator><creator>Khiat, Ali</creator><creator>Berdan, Radu</creator><creator>Hui Xu</creator><creator>Prodromakis, Themistoklis</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jinling Xing</au><au>Serb, Alexander</au><au>Khiat, Ali</au><au>Berdan, Radu</au><au>Hui Xu</au><au>Prodromakis, Themistoklis</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2016-06</date><risdate>2016</risdate><volume>63</volume><issue>6</issue><spage>818</spage><epage>826</epage><pages>818-826</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>An FPGA-based instrument with capabilities of on-board oscilloscope and nanoscale pulsing (70 ns @ ±10 V) is presented, thus allowing exploration of the nano-scale switching of RRAM devices. 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| identifier | ISSN: 1549-8328 |
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| source | IEEE Electronic Library (IEL) |
| subjects | Arrays Crossbar Data conversion Degradation Devices FPGA memristor array Memristors Nanostructure Oscilloscopes Rendering Resistance Resistors RRAM Switches Switching |
| title | An FPGA-Based Instrument for En-Masse RRAM Characterization With ns Pulsing Resolution |
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