Quantitatively Analyzing Strength Contribution vs Grain Boundary Scale Relation in Pure Titanium Subjected to Severe Plastic Deformation

Quantitatively Analyzing Strength Contribution vs Grain Boundary Scale Relation in Pure Titanium Subjected to Severe Plastic Deformation

Electron backscatter diffraction was used to reveal high- and low-angle grain boundaries (HAGBs, with misorientation ≥15 deg, and LAGBs,

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Veröffentlicht in:Metallurgical and materials transactions. A, Physical metallurgy and materials science Physical metallurgy and materials science, 2016-05, Vol.47 (5), p.1922-1928
Hauptverfasser: Luo, Peng, Hu, Qiaodan, Wu, Xiaolin
Format: Artikel
Sprache:eng
Schlagworte:
Analysis
Characterization and Evaluation of Materials
Chemistry and Materials Science
Communication
Electrons
Materials Science
Metallic Materials
Nanotechnology
Structural Materials
Surfaces and Interfaces
Thin Films
Titanium
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Zusammenfassung:Electron backscatter diffraction was used to reveal high- and low-angle grain boundaries (HAGBs, with misorientation ≥15 deg, and LAGBs,
ISSN:1073-5623
1543-1940
DOI:10.1007/s11661-016-3391-0