X-ray spectroscopy for chemistry in the 2-4keV energy regime at the XMaS beamline: ionic liquids, Rh and Pd catalysts in gas and liquid environments, and Cl contamination in [gamma]-Al2O3
The 2-4keV energy range provides a rich window into many facets of materials science and chemistry. Within this window, P, S, Cl, K and Ca K-edges may be found along with the L-edges of industrially important elements from Y through to Sn. Yet, compared with those that cater for energies above ca. 4...
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Veröffentlicht in: | Journal of synchrotron radiation 2015-11, Vol.22 (6), p.1426 |
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Sprache: | eng |
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