TCT-666 A Comparison Between New Generation And First Generation Transcatheter Aortic Valve Implantation (TAVI) Devices: A Single Centre Experience

First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality.

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Veröffentlicht in:Journal of the American College of Cardiology 2015-10, Vol.66 (15), p.B273-B273
Hauptverfasser: Ruparelia, Neil, Latib, Azeem, Giannini, Francesco, Figini, Filippo, Buzzatti, Nicola, Mangieri, Antonio, Regazzoli, Damiano, Stella, Stefano, Sticchi, Alessandro, Agricola, Eustachio, De Bonis, Michele, Monaco, Fabrizio, Spagnolo, Pietro, Chieffo, Alaide, Montorfano, Matteo, Alfieri, Ottavio, Colombo, Antonio
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container_end_page B273
container_issue 15
container_start_page B273
container_title Journal of the American College of Cardiology
container_volume 66
creator Ruparelia, Neil
Latib, Azeem
Giannini, Francesco
Figini, Filippo
Buzzatti, Nicola
Mangieri, Antonio
Regazzoli, Damiano
Stella, Stefano
Sticchi, Alessandro
Agricola, Eustachio
De Bonis, Michele
Monaco, Fabrizio
Spagnolo, Pietro
Chieffo, Alaide
Montorfano, Matteo
Alfieri, Ottavio
Colombo, Antonio
description First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality.
doi_str_mv 10.1016/j.jacc.2015.08.685
format Article
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source ScienceDirect Journals (5 years ago - present); EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection
subjects Cardiology
Cardiovascular
Internal Medicine
Mortality
title TCT-666 A Comparison Between New Generation And First Generation Transcatheter Aortic Valve Implantation (TAVI) Devices: A Single Centre Experience
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