TCT-666 A Comparison Between New Generation And First Generation Transcatheter Aortic Valve Implantation (TAVI) Devices: A Single Centre Experience
First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality.
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Veröffentlicht in: | Journal of the American College of Cardiology 2015-10, Vol.66 (15), p.B273-B273 |
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container_issue | 15 |
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container_title | Journal of the American College of Cardiology |
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creator | Ruparelia, Neil Latib, Azeem Giannini, Francesco Figini, Filippo Buzzatti, Nicola Mangieri, Antonio Regazzoli, Damiano Stella, Stefano Sticchi, Alessandro Agricola, Eustachio De Bonis, Michele Monaco, Fabrizio Spagnolo, Pietro Chieffo, Alaide Montorfano, Matteo Alfieri, Ottavio Colombo, Antonio |
description | First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality. |
doi_str_mv | 10.1016/j.jacc.2015.08.685 |
format | Article |
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source | ScienceDirect Journals (5 years ago - present); EZB-FREE-00999 freely available EZB journals; Alma/SFX Local Collection |
subjects | Cardiology Cardiovascular Internal Medicine Mortality |
title | TCT-666 A Comparison Between New Generation And First Generation Transcatheter Aortic Valve Implantation (TAVI) Devices: A Single Centre Experience |
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