TCT-666 A Comparison Between New Generation And First Generation Transcatheter Aortic Valve Implantation (TAVI) Devices: A Single Centre Experience

First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality.

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Veröffentlicht in:Journal of the American College of Cardiology 2015-10, Vol.66 (15), p.B273-B273
Hauptverfasser: Ruparelia, Neil, Latib, Azeem, Giannini, Francesco, Figini, Filippo, Buzzatti, Nicola, Mangieri, Antonio, Regazzoli, Damiano, Stella, Stefano, Sticchi, Alessandro, Agricola, Eustachio, De Bonis, Michele, Monaco, Fabrizio, Spagnolo, Pietro, Chieffo, Alaide, Montorfano, Matteo, Alfieri, Ottavio, Colombo, Antonio
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Sprache:eng
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Zusammenfassung:First generation devices were limited by non-negligible TAVI-related complications including >=2 paravalvular leak (PVL) and vascular complications that are predictors of mortality.
ISSN:0735-1097
1558-3597
DOI:10.1016/j.jacc.2015.08.685