Observing Skills of Secondary and Backscatter SEM Method of Shale

1 Introduction There are two ways to prepare SEM samples of shale, one is fresh fracture secondary electron method, the other is Ion-Milled Backscatter Method. Secondary electron SEM is 3-D image, can provide the original morphology, fossil and mineral ID is easier: Backscatter SEM (Ar-ion milled) h...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Acta geologica Sinica (Beijing) 2015-09, Vol.89 (s1), p.397-398
Hauptverfasser: JIAO, Shujing, ZHANG, Hui, XUE, Dongchuan
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:1 Introduction There are two ways to prepare SEM samples of shale, one is fresh fracture secondary electron method, the other is Ion-Milled Backscatter Method. Secondary electron SEM is 3-D image, can provide the original morphology, fossil and mineral ID is easier: Backscatter SEM (Ar-ion milled) have very flat surface and is 2-D image, the grayscale is proportional to density, and visible pores have well-defined outlines.
ISSN:1000-9515
1755-6724
DOI:10.1111/1755-6724.12306_17