Observing Skills of Secondary and Backscatter SEM Method of Shale
1 Introduction There are two ways to prepare SEM samples of shale, one is fresh fracture secondary electron method, the other is Ion-Milled Backscatter Method. Secondary electron SEM is 3-D image, can provide the original morphology, fossil and mineral ID is easier: Backscatter SEM (Ar-ion milled) h...
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Veröffentlicht in: | Acta geologica Sinica (Beijing) 2015-09, Vol.89 (s1), p.397-398 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | 1 Introduction
There are two ways to prepare SEM samples of shale, one is fresh fracture secondary electron method, the other is Ion-Milled Backscatter Method. Secondary electron SEM is 3-D image, can provide the original morphology, fossil and mineral ID is easier: Backscatter SEM (Ar-ion milled) have very flat surface and is 2-D image, the grayscale is proportional to density, and visible pores have well-defined outlines. |
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ISSN: | 1000-9515 1755-6724 |
DOI: | 10.1111/1755-6724.12306_17 |