Friction fade-out at polymer-like carbon films slid by ZrO^sub 2^ pins under hydrogen environment

Friction tests using ceramic pins against fully hydrogenated diamond-like carbon (polymer-like carbon, PLC) film under H.../He mixed gas or pure H... gas environment were conducted. The test results of ZrO... (YSZ: yttria-stabilized zirconia) pin slid against PLC film with an applied load of 4.9 N s...

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Veröffentlicht in:Proceedings of the Institution of Mechanical Engineers. Part J, Journal of engineering tribology Journal of engineering tribology, 2015-08, Vol.229 (8), p.1030
Hauptverfasser: Nosaka, Masataka, Mifune, Akira, Kawaguchi, Masahiro, Shiiba, Takashi, Kato, Takahisa
Format: Artikel
Sprache:eng
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Zusammenfassung:Friction tests using ceramic pins against fully hydrogenated diamond-like carbon (polymer-like carbon, PLC) film under H.../He mixed gas or pure H... gas environment were conducted. The test results of ZrO... (YSZ: yttria-stabilized zirconia) pin slid against PLC film with an applied load of 4.9 N showed that the friction coefficient dropped to the tribometer noise level (friction fade-out, FFO) as low as 0.0002. In another experiment with the same materials and with an applied load of 30.4 N, the friction coefficient dropped to 0.0001-0.0005, which continued more than 4 h. Optical microscope and scanning electron microscopic observations, nano-indentation, surface profiler, X-ray photoelectron spectroscopy, Raman, and time-of-flight secondary ion mass spectrometry measurements were conducted and the mechanism for inviting FFO is investigated. It is found by an optical microscopic observation that the transfer film has small blisters, indicating some gaseous substance is generated at the ZrO... surface. It is discussed based on the measurements that ZrO... catalysis plays very important roles for gaseous substances generation and for H-passivation on both PLC and transfer film surfaces, which are closely relating to FFO through gas-lubrication effect, and through reducing adhesive force, respectively. (ProQuest: ... denotes formulae/symbols omitted.)
ISSN:1350-6501
2041-305X