Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

Closed-Form Expressions for the Noise Voltage Caused by a Burst Train of IC Switching Currents on a Power Distribution Network

A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-fo...

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Veröffentlicht in:IEEE transactions on electromagnetic compatibility 2014-12, Vol.56 (6), p.1585-1597
Hauptverfasser: Kim, Jingook, Lee, Jongjoo, Ahn, Seungyoung, Fan, Jun
Format: Artikel
Sprache:eng
Schlagworte:
Burst noise
burst pattern
Bursting
Capacitors
Closed-form solutions
Electric potential
Exact solutions
Impedance
Integrated circuit modeling
Integrated circuits
Networks
Noise
Noise measurement
overshoot
power distribution network (PDN)
Switches
switching current
Switching theory
target impedance
Trains
transient noise
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Beschreibung
Zusammenfassung:A burst stimulus of data is a common activity in circuits and systems. The supply noise voltage waveform induced by a burst train of integrated circuit (IC) switching currents is rigorously derived for a power distribution network (PDN) with power traces, commonly used in handheld devices. Closed-form expressions are proposed to quickly estimate the amount of voltage drop and overshoot and to develop more complete PDN design methodology as improved target impedances. The proposed PDN noise expressions are also validated with SPICE simulation and measurements using a fabricated IC and PCB.
ISSN:0018-9375
1558-187X
DOI:10.1109/TEMC.2014.2315837