IDENTIFICACIÓN DE UNA NUEVA FASE EN LA ESTRUCTURA CRISTALINA DEL COMPUESTO CUATERNARIO CU^sub 2^ZNSNSE^sub 4^ DURANTE LA ETAPA INCORPORACIÓN DEL ZNSE/IDENTIFICATION OF A NEW PHASE IN THE CRYSTAL STRUCTURE OF COMPOSITE QUATERNARY CU^sub 2^ZNSNSE^sub 4^ STAGE DURING INCORPORATION OF ZNSE

This article presents a study of the structural properties of thin films of the compound Cu^sub 2^ZnSnSe^sub 4^ varying both mass and the substrate temperature which was evaporated (T^sub s^) ZnSe binary compound. All samples were deposited by co-evaporation method in three phases keeping all other parameters constant. From measurements of x-ray diffraction, it was possible to establish Ts increasing the presence of associated binary phase's quaternary compound during the growth process of the material. It was found that, around the main peak, ..., predominantly binary phases and the presence of ZnSe which is formed during the subsequent step of selenization of the material. A sort of fork in the main peak was observed for the transition between M^sub ZnSe^ = 0,153 g to 0,171 g. X-Ray diffraction measurements were made at binary compound pure, observing a correspondence with the peaks found around the main peak of the compound. (ProQuest: ... denotes formulae/symbols omitted.)