Materials characterization from diffraction intensity distribution in the [gamma]-direction

Two-dimensional X-ray diffraction (XRD2) pattern can be described by the diffraction intensity distribution in both 2[theta] and [gamma]-directions. The XRD2 images can be reduced to two kinds of profiles: 2[theta]-profile and [gamma]-profile. The 2[theta]-profile can be evaluated for phase identification, crystal structure refinement, and many applications with many existing algorithms and software. In order to evaluate the materials structure associated with the intensity distribution along [gamma]-angle, either the XRD2 pattern should be directly analyzed or the [gamma]-profile can be generated by 2[theta]-integration. A [gamma]-profile contains information on texture, stress, crystal size, and crystal orientation relations. This paper introduces the concept and fundamental algorithms for stress, texture, and crystal size analysis by the [gamma]-profile analysis. [PUBLICATION ABSTRACT]