Smoothing of X-ray diffraction data and K[alpha]2 elimination using penalized likelihood and the composite link model

X-ray diffraction scans consist of series of counts; these numbers obey Poisson distributions with varying expected values. These scans are often smoothed and the K[alpha]2 component is removed. This article proposes a framework in which both issues are treated. Penalized likelihood estimation is us...

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Veröffentlicht in:Journal of applied crystallography 2014-06, Vol.47 (3), p.852
Hauptverfasser: de Rooi, Johan J, van der Pers, Niek M, Hendrikx, Ruud W A, Delhez, Rob, Bottger, Amarante J, Eilers, Paul H C
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Sprache:eng
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Zusammenfassung:X-ray diffraction scans consist of series of counts; these numbers obey Poisson distributions with varying expected values. These scans are often smoothed and the K[alpha]2 component is removed. This article proposes a framework in which both issues are treated. Penalized likelihood estimation is used to smooth the data. The penalty combines the Poisson log-likelihood and a measure for roughness based on ideas from generalized linear models. To remove the K[alpha] doublet the model is extended using the composite link model. As a result the data are decomposed into two smooth components: a K[alpha]1 and a K[alpha]2 part. For both smoothing and K[alpha]2 removal, the weight of the applied penalty is optimized automatically. The proposed methods are applied to experimental data and compared with the Savitzky-Golay algorithm for smoothing and the Rachinger method for K[alpha]2 stripping. The new method shows better results with less local distortion. Freely available software in MATLAB and R has been developed. [PUBLICATION ABSTRACT]
ISSN:0021-8898
1600-5767
DOI:10.1107/S1600576714005809