Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneou...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2014-03, Vol.22 (3), p.696-700
Hauptverfasser:	Kundu, Subhadip, Jha, Aniket, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit
Format:	Artikel
Sprache:	eng
Schlagworte:	Automatic test pattern generation (ATPG) Constrictions Diagnosis effect-cause analysis Experimentation fault diagnosis Faults Integrated circuits multiple fault injection particle swarm optimization (PSO) Simulation Swarm intelligence Very large scale integration
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