Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneou...

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Veröffentlicht in:IEEE transactions on very large scale integration (VLSI) systems 2014-03, Vol.22 (3), p.696-700
Hauptverfasser: Kundu, Subhadip, Jha, Aniket, Chattopadhyay, Santanu, Sengupta, Indranil, Kapur, Rohit
Format: Artikel
Sprache:eng
Schlagworte:
Automatic test pattern generation (ATPG)
Constrictions
Diagnosis
effect-cause analysis
Experimentation
fault diagnosis
Faults
Integrated circuits
multiple fault injection
particle swarm optimization (PSO)
Simulation
Swarm intelligence
Very large scale integration
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Beschreibung
Zusammenfassung:This brief proposes a framework to analyze multiple faults based on multiple fault simulation in a particle swarm optimization environment. Experimentation shows that up to ten faults can be diagnosed in a reasonable time. However, the scheme does not put any restriction on the number of simultaneous faults.
ISSN:1063-8210
1557-9999
DOI:10.1109/TVLSI.2013.2249542