High-resolution characterization of activated graphene for supercapacitor applications

High-resolution characterization of activated graphene for supercapacitor applications

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1536-1537
Hauptverfasser: Stach, E.A., Su, D., Yager, K., Ercius, P., Ganesh, K.J., Ferreira, P.J., Zhu, Y., Murali, S., Stoller, M.D., Ruoff, R.S., Pirkle, A., Wallace, R., Cychosz, K.A., Thommes, M.
Format: Artikel
Sprache:eng
Schlagworte:
Carbon
Graphene
Materials science
Nanomaterials
Physical Science Symposium
Porous materials
Scanning electron microscopy
Spectrum analysis
Structural, Chemical and Physical Properties of Carbon-based and Related Nanomaterials-05
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612009531