Scanning Probe Microscopy Based Characterizations of III-V Semiconductor Quantum Well Devices
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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| Veröffentlicht in: | Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1810-1811 |
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| container_end_page | 1811 |
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| container_issue | S2 |
| container_start_page | 1810 |
| container_title | Microscopy and microanalysis |
| container_volume | 18 |
| creator | Yakes, M. Mahadik, N. Qadri, S.B. Aifer, E.H. Vurgaftman, I. Meyer, J.R. Laracuente, A.R. |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. |
| doi_str_mv | 10.1017/S1431927612010902 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1810-1811 |
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| language | eng |
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| source | Cambridge University Press Journals Complete |
| subjects | Microscopy Microscopy and Analysis of Quantum Structures and Devices-01 Physical Science Symposium |
| title | Scanning Probe Microscopy Based Characterizations of III-V Semiconductor Quantum Well Devices |
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