Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films

Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1310-1311
Hauptverfasser: Kim, Y., He, J., Biegalski, M.D., Ambaye, H.A., Lauter, V., Christen, H.M., Pennycook, S.J., Kalinin, S.V., Pantelides, S.T.
Format: Artikel
Sprache:eng
Schlagworte:
Electron Microscopy/Spectroscopy of Energy-Related Materials-03
Physical Science Symposium
Thin films
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612008409