Insights Into Energy Materials Through Aberration-Corrected STEM

Insights Into Energy Materials Through Aberration-Corrected STEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1354-1355
Hauptverfasser: Pennycook, S.J., Varela, M., Lupini, A.R., Oxley, M.P., Zhou, W., Lee, J., Idrobo, J.C., Pennycook, T.J., Pantelides, S.T.
Format: Artikel
Sprache:eng
Schlagworte:
Electron Microscopy/Spectroscopy of Energy-Related Materials-08
Electrons
Energy
Graphene
Microscopy
Physical Science Symposium
Point defects
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612008628