Thin Films: Mapping Spatially Resolved Charge Collection Probability within P3HT:PCBM Bulk Heterojunction Photovoltaics (Adv. Energy Mater. 2/2014)

In article 1300525, D. M. Nanditha M. Dissanayake and co‐workers show that unlike the behavior observed thicknesses typically used for devices (100 nm), electron‐limited behavior is seen for a thicker active layer (920 nm) due to phase segregation in poly(3‐hexythiophene‐2,5‐diyl):phenyl‐C61‐butyric...

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Veröffentlicht in:Advanced energy materials 2014-01, Vol.4 (2), p.n/a
Hauptverfasser: Dissanayake, D. M. Nanditha M., Ashraf, Ahsan, Pang, Yutong, Eisaman, Matthew D.
Format: Artikel
Sprache:eng
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Zusammenfassung:In article 1300525, D. M. Nanditha M. Dissanayake and co‐workers show that unlike the behavior observed thicknesses typically used for devices (100 nm), electron‐limited behavior is seen for a thicker active layer (920 nm) due to phase segregation in poly(3‐hexythiophene‐2,5‐diyl):phenyl‐C61‐butyric acid methyl ester (P3HT:PCBM). The illustration shows prism‐coupled guidedmodes used for spatially selective excitation in a P3HT:PCBM photovoltaic, which are used to obtain high‐resolution profiles of charge‐collection probability in the photoactive layer.
ISSN:1614-6832
1614-6840
DOI:10.1002/aenm.201470008