Lifetime Estimation of High Power White LEDs

We have developed a high power and long lifetime white LED module which can be used in general lighting applications. Since the materials in the package are very robust at high temperatures, the device can be operated at junction temperatures (Tj) over 250°C. Moreover, the thermal resistance of the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of Light & Visual Environment 2007, Vol.31(1), pp.11-18
Hauptverfasser: ISHIZAKI, Shinya, KIMURA, Hideyoshi, SUGIMOTO, Masaru
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 18
container_issue 1
container_start_page 11
container_title Journal of Light & Visual Environment
container_volume 31
creator ISHIZAKI, Shinya
KIMURA, Hideyoshi
SUGIMOTO, Masaru
description We have developed a high power and long lifetime white LED module which can be used in general lighting applications. Since the materials in the package are very robust at high temperatures, the device can be operated at junction temperatures (Tj) over 250°C. Moreover, the thermal resistance of the package is less than 20°C/W. Therefore the device can be operated at input power as high as 2.4 W, making it possible to shorten the duration of accelerated lifetime tests. An acceleration ratio greater than 100 has been achieved. Assuming a thermally activated degradation process and applying the Arrhenius model, the LED chip lifetime (defined as a 50% reduction in luminous flux) is determined to be 40,000 hours for a Tj of 130°C. The activation energy of the degradation process was determined to be 1.55 eV.
doi_str_mv 10.2150/jlve.31.11
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1463906550</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>3143704631</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4331-5d2b3d241daf8dca63d6e429c3ad073a27b0384da9ced31bab4dbc22340c7c3d3</originalsourceid><addsrcrecordid>eNpFkEFLw0AQhRdRsFYv_oKANzF1Z2eTbE4ibbVCQA-Kx2WzO2kTalN3U8V_b0qkXuYd5mPem8fYJfCJgITfNusvmiBMAI7YCFDmscJcHbMRR5XFSvHklJ2F0HCOApUYsZuirqirPyiah15MV7ebqK2iRb1cRS_tN_nofVV3FBXzWThnJ5VZB7r40zF7e5i_Thdx8fz4NL0vYisRIU6cKNEJCc5UylmToktJityicTxDI7KyjyOdyS05hNKU0pVWCJTcZhYdjtnVcHfr288dhU437c5veksNMsWcp0nCe-p6oKxvQ_BU6a3vP_A_Grjet6H3bWgEDdDDdwPchM4s6YAa39V2Tf_oMAAOG7syXtMGfwFIH2hX</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1463906550</pqid></control><display><type>article</type><title>Lifetime Estimation of High Power White LEDs</title><source>Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals</source><source>J-STAGE (Japan Science &amp; Technology Information Aggregator, Electronic) Freely Available Titles - Japanese</source><source>Open Access Titles of Japan</source><creator>ISHIZAKI, Shinya ; KIMURA, Hideyoshi ; SUGIMOTO, Masaru</creator><creatorcontrib>ISHIZAKI, Shinya ; KIMURA, Hideyoshi ; SUGIMOTO, Masaru</creatorcontrib><description>We have developed a high power and long lifetime white LED module which can be used in general lighting applications. Since the materials in the package are very robust at high temperatures, the device can be operated at junction temperatures (Tj) over 250°C. Moreover, the thermal resistance of the package is less than 20°C/W. Therefore the device can be operated at input power as high as 2.4 W, making it possible to shorten the duration of accelerated lifetime tests. An acceleration ratio greater than 100 has been achieved. Assuming a thermally activated degradation process and applying the Arrhenius model, the LED chip lifetime (defined as a 50% reduction in luminous flux) is determined to be 40,000 hours for a Tj of 130°C. The activation energy of the degradation process was determined to be 1.55 eV.</description><identifier>ISSN: 0387-8805</identifier><identifier>EISSN: 1349-8398</identifier><identifier>DOI: 10.2150/jlve.31.11</identifier><language>eng</language><publisher>Tokyo: The Illuminating Engineering Institute of Japan</publisher><subject>Arrhenius ; GaN ; high power ; InGaN ; LED ; lifetime ; white</subject><ispartof>Journal of Light &amp; Visual Environment, 2007, Vol.31(1), pp.11-18</ispartof><rights>2007 The Illuminating Engineering Institute of Japan</rights><rights>Copyright Japan Science and Technology Agency 2007</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4331-5d2b3d241daf8dca63d6e429c3ad073a27b0384da9ced31bab4dbc22340c7c3d3</citedby><cites>FETCH-LOGICAL-c4331-5d2b3d241daf8dca63d6e429c3ad073a27b0384da9ced31bab4dbc22340c7c3d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,1883,27924,27925</link.rule.ids></links><search><creatorcontrib>ISHIZAKI, Shinya</creatorcontrib><creatorcontrib>KIMURA, Hideyoshi</creatorcontrib><creatorcontrib>SUGIMOTO, Masaru</creatorcontrib><title>Lifetime Estimation of High Power White LEDs</title><title>Journal of Light &amp; Visual Environment</title><description>We have developed a high power and long lifetime white LED module which can be used in general lighting applications. Since the materials in the package are very robust at high temperatures, the device can be operated at junction temperatures (Tj) over 250°C. Moreover, the thermal resistance of the package is less than 20°C/W. Therefore the device can be operated at input power as high as 2.4 W, making it possible to shorten the duration of accelerated lifetime tests. An acceleration ratio greater than 100 has been achieved. Assuming a thermally activated degradation process and applying the Arrhenius model, the LED chip lifetime (defined as a 50% reduction in luminous flux) is determined to be 40,000 hours for a Tj of 130°C. The activation energy of the degradation process was determined to be 1.55 eV.</description><subject>Arrhenius</subject><subject>GaN</subject><subject>high power</subject><subject>InGaN</subject><subject>LED</subject><subject>lifetime</subject><subject>white</subject><issn>0387-8805</issn><issn>1349-8398</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2007</creationdate><recordtype>article</recordtype><recordid>eNpFkEFLw0AQhRdRsFYv_oKANzF1Z2eTbE4ibbVCQA-Kx2WzO2kTalN3U8V_b0qkXuYd5mPem8fYJfCJgITfNusvmiBMAI7YCFDmscJcHbMRR5XFSvHklJ2F0HCOApUYsZuirqirPyiah15MV7ebqK2iRb1cRS_tN_nofVV3FBXzWThnJ5VZB7r40zF7e5i_Thdx8fz4NL0vYisRIU6cKNEJCc5UylmToktJityicTxDI7KyjyOdyS05hNKU0pVWCJTcZhYdjtnVcHfr288dhU437c5veksNMsWcp0nCe-p6oKxvQ_BU6a3vP_A_Grjet6H3bWgEDdDDdwPchM4s6YAa39V2Tf_oMAAOG7syXtMGfwFIH2hX</recordid><startdate>20070101</startdate><enddate>20070101</enddate><creator>ISHIZAKI, Shinya</creator><creator>KIMURA, Hideyoshi</creator><creator>SUGIMOTO, Masaru</creator><general>The Illuminating Engineering Institute of Japan</general><general>Japan Science and Technology Agency</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20070101</creationdate><title>Lifetime Estimation of High Power White LEDs</title><author>ISHIZAKI, Shinya ; KIMURA, Hideyoshi ; SUGIMOTO, Masaru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4331-5d2b3d241daf8dca63d6e429c3ad073a27b0384da9ced31bab4dbc22340c7c3d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Arrhenius</topic><topic>GaN</topic><topic>high power</topic><topic>InGaN</topic><topic>LED</topic><topic>lifetime</topic><topic>white</topic><toplevel>online_resources</toplevel><creatorcontrib>ISHIZAKI, Shinya</creatorcontrib><creatorcontrib>KIMURA, Hideyoshi</creatorcontrib><creatorcontrib>SUGIMOTO, Masaru</creatorcontrib><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of Light &amp; Visual Environment</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ISHIZAKI, Shinya</au><au>KIMURA, Hideyoshi</au><au>SUGIMOTO, Masaru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Lifetime Estimation of High Power White LEDs</atitle><jtitle>Journal of Light &amp; Visual Environment</jtitle><date>2007-01-01</date><risdate>2007</risdate><volume>31</volume><issue>1</issue><spage>11</spage><epage>18</epage><pages>11-18</pages><issn>0387-8805</issn><eissn>1349-8398</eissn><abstract>We have developed a high power and long lifetime white LED module which can be used in general lighting applications. Since the materials in the package are very robust at high temperatures, the device can be operated at junction temperatures (Tj) over 250°C. Moreover, the thermal resistance of the package is less than 20°C/W. Therefore the device can be operated at input power as high as 2.4 W, making it possible to shorten the duration of accelerated lifetime tests. An acceleration ratio greater than 100 has been achieved. Assuming a thermally activated degradation process and applying the Arrhenius model, the LED chip lifetime (defined as a 50% reduction in luminous flux) is determined to be 40,000 hours for a Tj of 130°C. The activation energy of the degradation process was determined to be 1.55 eV.</abstract><cop>Tokyo</cop><pub>The Illuminating Engineering Institute of Japan</pub><doi>10.2150/jlve.31.11</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 0387-8805
ispartof Journal of Light & Visual Environment, 2007, Vol.31(1), pp.11-18
issn 0387-8805
1349-8398
language eng
recordid cdi_proquest_journals_1463906550
source Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; J-STAGE (Japan Science & Technology Information Aggregator, Electronic) Freely Available Titles - Japanese; Open Access Titles of Japan
subjects Arrhenius
GaN
high power
InGaN
LED
lifetime
white
title Lifetime Estimation of High Power White LEDs
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T03%3A39%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Lifetime%20Estimation%20of%20High%20Power%20White%20LEDs&rft.jtitle=Journal%20of%20Light%20&%20Visual%20Environment&rft.au=ISHIZAKI,%20Shinya&rft.date=2007-01-01&rft.volume=31&rft.issue=1&rft.spage=11&rft.epage=18&rft.pages=11-18&rft.issn=0387-8805&rft.eissn=1349-8398&rft_id=info:doi/10.2150/jlve.31.11&rft_dat=%3Cproquest_cross%3E3143704631%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1463906550&rft_id=info:pmid/&rfr_iscdi=true