THE REMOTE LABORATORY AND MICROHARDNESS MEASUREMENT

THE REMOTE LABORATORY AND MICROHARDNESS MEASUREMENT

The measurement of micro-hardness with loads between 0.09807 N and 0.9807 N has been carried out in direct mode (appraiser measured the dimensions of indentations with a measuring device fitted to the micro-hardness tester, a part of microscope) and in modified remote modes. The reference block - ce...

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Veröffentlicht in:Acta Technica Corvininesis 2013-10, Vol.6 (4), p.81
Hauptverfasser: Petrík, Jozef, Palfy, Pavol, Miklos, Vojtech, Havlík, Milan
Format: Artikel
Sprache:eng
Schlagworte:
Distance learning
Experiments
Internet
Laboratories
Load
Microhardness
Semiconductors
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Zusammenfassung:The measurement of micro-hardness with loads between 0.09807 N and 0.9807 N has been carried out in direct mode (appraiser measured the dimensions of indentations with a measuring device fitted to the micro-hardness tester, a part of microscope) and in modified remote modes. The reference block - certified reference material with defined specified hardness and its uncertainty was used as a specimen, particular measurement involved indirect calibration of tester. The influence of applied load on the measured value of micro-hardness was evaluated by Meyer's index n and PSR method. The difference between values obtained by particular modes is statistically significant. [PUBLICATION ABSTRACT]
ISSN:2067-3809