A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle
Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state....
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| Veröffentlicht in: | Analytical Sciences 1997/12/10, Vol.13(6), pp.997-1001 |
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| creator | ZHENG, Songyan GOHSHI, Yohichi |
| description | Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state. The results of calculations show that the signal to background ratio (S/B) of XANES at incidence angle of 4mrad is greater than that at incidence angle of 12mrad. Experimental results are in agreement with numerical simulations. |
| doi_str_mv | 10.2116/analsci.13.997 |
| format | Article |
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A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state. The results of calculations show that the signal to background ratio (S/B) of XANES at incidence angle of 4mrad is greater than that at incidence angle of 12mrad. Experimental results are in agreement with numerical simulations.</description><identifier>ISSN: 0910-6340</identifier><identifier>EISSN: 1348-2246</identifier><identifier>DOI: 10.2116/analsci.13.997</identifier><identifier>CODEN: ANSCEN</identifier><language>eng</language><publisher>Tokyo: The Japan Society for Analytical Chemistry</publisher><subject>Atomic and molecular physics ; Atomic properties and interactions with photons ; Atomic spectra ; conversion electron yield ; critical angle ; Exact sciences and technology ; Physics ; total electron yield ; X-ray adsorption near edge structure ; X-ray photoelectron spectroscopy ; X-ray spectra ; X-ray total reflection</subject><ispartof>Analytical Sciences, 1997/12/10, Vol.13(6), pp.997-1001</ispartof><rights>The Japan Society for Analytical Chemistry</rights><rights>1998 INIST-CNRS</rights><rights>Copyright Japan Science and Technology Agency 1997</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c590t-f57f66e91fa841a8d18f65d33492893f7ead549f50dd7a4eeb030e8c6848280e3</citedby><cites>FETCH-LOGICAL-c590t-f57f66e91fa841a8d18f65d33492893f7ead549f50dd7a4eeb030e8c6848280e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,777,781,1877,4010,27904,27905,27906</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2106665$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>ZHENG, Songyan</creatorcontrib><creatorcontrib>GOHSHI, Yohichi</creatorcontrib><title>A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle</title><title>Analytical Sciences</title><description>Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. 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Experimental results are in agreement with numerical simulations.</description><subject>Atomic and molecular physics</subject><subject>Atomic properties and interactions with photons</subject><subject>Atomic spectra</subject><subject>conversion electron yield</subject><subject>critical angle</subject><subject>Exact sciences and technology</subject><subject>Physics</subject><subject>total electron yield</subject><subject>X-ray adsorption near edge structure</subject><subject>X-ray photoelectron spectroscopy</subject><subject>X-ray spectra</subject><subject>X-ray total reflection</subject><issn>0910-6340</issn><issn>1348-2246</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9kEtP4zAURi0EEuWxZW2J2abjV1x7WVApSGhGoiDByrp17JASEsZ2FuXX46idbmzJ93znWh9CV5RMGaXyN3TQRttMKZ9qPTtCE8qFKhgT8hhNiKakkFyQU3QW44YQyhRjE7Se41XzObSQmr7DqzRUW9z7_FZnG049vgH7UYd-6Cr8NELj9HX-Z7HC6y1-7lOmFq2zKeT4W-PaCkPCywDfTVfjeVe37gKd-Pwzd7m_z9HL3eL59r54_Lt8uJ0_FrbUJBW-nHkpnaYelKCgKqq8LCvOhWZKcz9zUJVC-5JU1QyEc2vCiVNWKqGYIo6fo-ud9yv0_wYXk9n0QxhLMVQIVTKRsUxNd5QNfYzBefMVmk8IW0OJGXs0-x4N5Sb3mAO_9lqIFlofoLNNPKQYJVLKMmPLHbaJCWp3mENIjW3dfyvVqhzNcnfkBQfCvkMwruM_idqMSA</recordid><startdate>1997</startdate><enddate>1997</enddate><creator>ZHENG, Songyan</creator><creator>GOHSHI, Yohichi</creator><general>The Japan Society for Analytical Chemistry</general><general>Japan Society for Analytical Chemistry</general><general>Japan Science and Technology Agency</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QO</scope><scope>7QQ</scope><scope>7SE</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>FR3</scope><scope>H8G</scope><scope>JG9</scope><scope>L7M</scope><scope>P64</scope></search><sort><creationdate>1997</creationdate><title>A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle</title><author>ZHENG, Songyan ; GOHSHI, Yohichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c590t-f57f66e91fa841a8d18f65d33492893f7ead549f50dd7a4eeb030e8c6848280e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Atomic and molecular physics</topic><topic>Atomic properties and interactions with photons</topic><topic>Atomic spectra</topic><topic>conversion electron yield</topic><topic>critical angle</topic><topic>Exact sciences and technology</topic><topic>Physics</topic><topic>total electron yield</topic><topic>X-ray adsorption near edge structure</topic><topic>X-ray photoelectron spectroscopy</topic><topic>X-ray spectra</topic><topic>X-ray total reflection</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>ZHENG, Songyan</creatorcontrib><creatorcontrib>GOHSHI, Yohichi</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Biotechnology Research Abstracts</collection><collection>Ceramic Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Copper Technical Reference Library</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>Analytical Sciences</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>ZHENG, Songyan</au><au>GOHSHI, Yohichi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle</atitle><jtitle>Analytical Sciences</jtitle><date>1997</date><risdate>1997</risdate><volume>13</volume><issue>6</issue><spage>997</spage><epage>1001</epage><pages>997-1001</pages><issn>0910-6340</issn><eissn>1348-2246</eissn><coden>ANSCEN</coden><abstract>Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. 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| source | J-STAGE Free; Elektronische Zeitschriftenbibliothek - Frei zugängliche E-Journals; Freely Accessible Japanese Titles; Free Full-Text Journals in Chemistry |
| subjects | Atomic and molecular physics Atomic properties and interactions with photons Atomic spectra conversion electron yield critical angle Exact sciences and technology Physics total electron yield X-ray adsorption near edge structure X-ray photoelectron spectroscopy X-ray spectra X-ray total reflection |
| title | A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle |
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