A Simulation Study of Signal to Background Ratio of XANES by Total Electron Yield at Grazing Angle

Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state....

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Veröffentlicht in:	Analytical Sciences 1997/12/10, Vol.13(6), pp.997-1001
Hauptverfasser:	ZHENG, Songyan, GOHSHI, Yohichi
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic and molecular physics Atomic properties and interactions with photons Atomic spectra conversion electron yield critical angle Exact sciences and technology Physics total electron yield X-ray adsorption near edge structure X-ray photoelectron spectroscopy X-ray spectra X-ray total reflection
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Beschreibung
Zusammenfassung:	Numerical simulations of X-ray absorption near edge structure (XANES) of Au L3-edge have been done by total electron yield (TEY) at grazing incidence angles of 12mrad and 4mrad. A 4mrad incidence angle is a total reflection condition and a 12mrad incidence angle is above the total reflection state. The results of calculations show that the signal to background ratio (S/B) of XANES at incidence angle of 4mrad is greater than that at incidence angle of 12mrad. Experimental results are in agreement with numerical simulations.
ISSN:	0910-6340 1348-2246
DOI:	10.2116/analsci.13.997