Fault Knowledge Acquisition of Electronic Equipment
The difficulties of acquiring fault knowledge severely handicap the development of intelligent diagnosis system (IDS) of military electronic equipment (MEE) in our country.For MEE fault diagnosis of fault original data collection difficult situation, a new method is presented,Which auto-acquires fau...
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Veröffentlicht in: | Applied Mechanics and Materials 2013-09, Vol.397-400, p.1145-1147 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The difficulties of acquiring fault knowledge severely handicap the development of intelligent diagnosis system (IDS) of military electronic equipment (MEE) in our country.For MEE fault diagnosis of fault original data collection difficult situation, a new method is presented,Which auto-acquires fault knowledge by simulating all possible faults of equipment.The approach presented in this paper makes the work of KA engineer easier, and makes fast diagnosis fault location and fault reasons possible. |
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ISSN: | 1660-9336 1662-7482 1662-7482 |
DOI: | 10.4028/www.scientific.net/AMM.397-400.1145 |