Structural and dielectric studies of Eu^sup 3+^/Ag nanocrystallites: SiO2â[euro]"TiO2 matrices

Silver nanocrystallites/Eu^sup 3+^ doped SiO2â[euro]"TiO2 matrices were synthesised through solâ[euro]"gel route and the structural and dielectric properties of the matrices were studied. Structural characterizations were done using EDX, XRD, FTIR, AFM and TEM measurements. The TEM and XRD...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2013-05, Vol.24 (5), p.1727
Hauptverfasser: Arun Kumar, K V, Thomas, Sunil, Gopinath, Manju, Biju, P R, Unnikrishnan, N V
Format: Artikel
Sprache:eng
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Zusammenfassung:Silver nanocrystallites/Eu^sup 3+^ doped SiO2â[euro]"TiO2 matrices were synthesised through solâ[euro]"gel route and the structural and dielectric properties of the matrices were studied. Structural characterizations were done using EDX, XRD, FTIR, AFM and TEM measurements. The TEM and XRD measurements confirm the presence of Ag and TiO2 nanocrystals. The dielectric and electrical conductivity studies of the samples were done for a frequency range of 100Â Hzâ[euro]"2Â MHz. The conductivity variation with the Ag content in the Eu^sup 3+^ doped SiO2â[euro]"TiO2 system has been explained by correlating the presence of ionic contribution to the electrical conductivity process. Also, the frequency dependence of dielectric constant and conductivity were studied. The Coleâ[euro]"Cole parameters were calculated and the semicircles observed in the plots indicate a single relaxation process. This behaviour can be modelled by an equivalent parallel RC circuit.[PUBLICATION ABSTRACT]
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-012-1005-1