Structural variation in amorphous Ge

Structural variation in amorphous Ge

Differences were detected in the relative peak heights in electron diffraction patterns from amorphous Ge films that were identical except for differing angles of incidence during deposition.

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Veröffentlicht in:Philosophical magazine (London, England : 1945) England : 1945), 1973-11, Vol.28 (5), p.1149-1151
1. Verfasser: Rudee, M. L.
Format: Artikel
Sprache:eng
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Zusammenfassung:Differences were detected in the relative peak heights in electron diffraction patterns from amorphous Ge films that were identical except for differing angles of incidence during deposition.
ISSN:0031-8086
DOI:10.1080/14786437308220974