X-Ray Microtopographs of Alpha Alumina Whiskers

X-Ray Microtopographs of Alpha Alumina Whiskers

Alpha alumina whiskers grown by the vapor reaction 2A1 + 3H2O° Al2O3+ 3H2 were examined by X‐ray microtopography. Topographs of whiskers PO to 60 μm in diameter were taken by (1120) and (00012) diffraction; most a and c whiskers (growth direction 〈1120〉 and 〈0001〉, respectively) were free from dislo...

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Veröffentlicht in:Journal of the American Ceramic Society 1969-05, Vol.52 (5), p.282-284
Hauptverfasser: MINAGAWA, SHIGEKAZU, GEJYO, TETSUO
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container_title Journal of the American Ceramic Society
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creator MINAGAWA, SHIGEKAZU
GEJYO, TETSUO
description Alpha alumina whiskers grown by the vapor reaction 2A1 + 3H2O° Al2O3+ 3H2 were examined by X‐ray microtopography. Topographs of whiskers PO to 60 μm in diameter were taken by (1120) and (00012) diffraction; most a and c whiskers (growth direction 〈1120〉 and 〈0001〉, respectively) were free from dislocations. Chemical etching of a whisker cross section with orthophosphoric acid or potassium bisulfate did not produce etch pits. Growth of alumina whiskers through axial dislocation appears improbable.
doi_str_mv 10.1111/j.1151-2916.1969.tb09184.x
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title X-Ray Microtopographs of Alpha Alumina Whiskers
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