X-Ray Microtopographs of Alpha Alumina Whiskers
Alpha alumina whiskers grown by the vapor reaction 2A1 + 3H2O° Al2O3+ 3H2 were examined by X‐ray microtopography. Topographs of whiskers PO to 60 μm in diameter were taken by (1120) and (00012) diffraction; most a and c whiskers (growth direction 〈1120〉 and 〈0001〉, respectively) were free from dislo...
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| Veröffentlicht in: | Journal of the American Ceramic Society 1969-05, Vol.52 (5), p.282-284 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | Alpha alumina whiskers grown by the vapor reaction 2A1 + 3H2O° Al2O3+ 3H2 were examined by X‐ray microtopography. Topographs of whiskers PO to 60 μm in diameter were taken by (1120) and (00012) diffraction; most a and c whiskers (growth direction 〈1120〉 and 〈0001〉, respectively) were free from dislocations. Chemical etching of a whisker cross section with orthophosphoric acid or potassium bisulfate did not produce etch pits. Growth of alumina whiskers through axial dislocation appears improbable. |
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| ISSN: | 0002-7820 1551-2916 |
| DOI: | 10.1111/j.1151-2916.1969.tb09184.x |