Materials and Corrosion 1/2013

Cover: Backscattered scanning electron microscopy cross sectional image of a Ni/NiPd/Au electronic connector after 10 days exposure to a Class III mixed flowing gas (MFG) corrosive atmosphere. This work was carried out at the Stokes Research Institute Laboratories, University of Limerick, Ireland wi...

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Veröffentlicht in:Materials and corrosion 2013-01, Vol.64 (1), p.3-n/a
Hauptverfasser: Collins, M. N., Reid, M., Dalton, E., Shannon, K., Garfias-Mesias, L. F.
Format: Artikel
Sprache:eng
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Zusammenfassung:Cover: Backscattered scanning electron microscopy cross sectional image of a Ni/NiPd/Au electronic connector after 10 days exposure to a Class III mixed flowing gas (MFG) corrosive atmosphere. This work was carried out at the Stokes Research Institute Laboratories, University of Limerick, Ireland with collaborators in Det Norske Veritas (U.S.A.), Inc and Southwest Research Institute, San Antonio, TX, USA. Further details on the performance of various connector coatings can be found in: M. N. Collins, M. Reid, E. Dalton, K. Shannon, L. F. Garfias‐Mesias , Mixed flowing gas (MFG) corrosion of various connector coatings, Materials and Corrosion  2013 , 64 , 7 .
ISSN:0947-5117
1521-4176
DOI:10.1002/maco.201390000