A Comprehensive Methodology to Rate SETs of Complex Analog and Mixed-Signal Circuits Demonstrated on 16-bit A-to-D Converters

3-D histograms grading the frequency of occurrence of pulsed-laser and heavy-ion induced ASETs against their durations and amplitudes are collected and interpreted on both radiation-hardened and commercial 16-bit ADCs operated at 10 MSps. The histograms encompass traditional cross-section tabulations, modeled after digital upset scoring techniques based on counting events that exceed an arbitrary threshold; yet, they provide a more exhaustive alternative. This data representation technique offers an intuitive visual assessment of the circuit response to radiation, which helped us identify in heavy-ion test results the same trend of ASET width increase, peak decrease versus LET recently published for laser data. The method proposed in this work hinges on a database structure that allows for the definition of custom figures of merit, providing a comprehensive tool for rating radiation hardness in complex analog and mixed-signal circuits.