Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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| Veröffentlicht in: | Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1022-1023 |
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| container_end_page | 1023 |
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| container_issue | S2 |
| container_start_page | 1022 |
| container_title | Microscopy and microanalysis |
| container_volume | 18 |
| creator | Michaud, P. Gauvin, R. Demers, H. Brodusch, N. Guinel, M.J. |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. |
| doi_str_mv | 10.1017/S1431927612006964 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.1022-1023 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_1270476804 |
| source | Alma/SFX Local Collection |
| subjects | Efficiency Electron microscopes Hypotheses Instrumentation Symposium Microscopy Monte Carlo simulation Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-06 Sensors X-rays |
| title | Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data |
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