Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data

Simulated X-ray Spectra and X-ray Maps: Evaluation of Models Used in MC X-Ray Monte Carlo Simulation Program and Comparison with Experimental Data

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.1022-1023
Hauptverfasser: Michaud, P., Gauvin, R., Demers, H., Brodusch, N., Guinel, M.J.
Format: Artikel
Sprache:eng
Schlagworte:
Efficiency
Electron microscopes
Hypotheses
Instrumentation Symposium
Microscopy
Monte Carlo simulation
Quantification from the Micro- to Sub-nano Scales: Pushing the Limits-06
Sensors
X-rays
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Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612006964