Structural and Elemental Analysis of Heavily- Doped ZnO

Structural and Elemental Analysis of Heavily- Doped ZnO

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.392-393
Hauptverfasser: Kvit, A.V., Yankovich, A.B., Puchala, B.T., Morgan, D.D., Voyles, P.M., Avrutin, V., Liu, H., Izyumskaya, N., Özgür, U., Morkoç, H.
Format: Artikel
Sprache:eng
Schlagworte:
Applications of Aberration-Corrected STEM and SEM-08
Defects
Grain boundaries
Instrumentation Symposium
Misfit dislocations
Molecular beam epitaxy
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612003819