Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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| Veröffentlicht in: | Microscopy and microanalysis 2012-07, Vol.18 (S2), p.340-341 |
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| container_end_page | 341 |
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| container_issue | S2 |
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| container_title | Microscopy and microanalysis |
| container_volume | 18 |
| creator | Huang, P.Y. Hovden, R. Mao, Q. Muller, D.A. Kurasch, S. Kaiser, U. Kotakoski, J. Krasheninnikov, A. Srivastava, A. Skakalova, V. Smet, J. Meyer, J. |
| description | Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. |
| doi_str_mv | 10.1017/S1431927612003558 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1270471278</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927612003558</cupid><sourcerecordid>2868060641</sourcerecordid><originalsourceid>FETCH-LOGICAL-c184t-82c08c57824bb7f141e068d4eda21e5147f834a730aabf878d16d344ea533d0a3</originalsourceid><addsrcrecordid>eNp1kFFLwzAQx4MoTqcfwLeAz9VckjbxcUydg4HI9LmkaToy2qYmqbBvb-b2IIgvd8fd7_-_4xC6AXIHBMT9GjiDByoKoISwPJcn6CK18kwC5Kc_NWT7-QRdhrAlCSKiOEcTmmSQmAu0ehtVH21U0X4ZPIuuszrzJrh2jNb1eNmpje03WPU1Xg9GR--CdsMOuwYrTB_x2rZWK7xoVQhX6KxRbTDXxzxFH89P7_OXbPW6WM5nq0yD5DGTVBOpcyEpryrRAAdDCllzUysKJgcuGsm4EowoVTVSyBqKmnFuVM5YTRSbotuD7-Dd52hCLLdu9H1aWQIVhIsUZaLgQOl0c_CmKQdvO-V3JZBy_7_yz_-Shh01qqu8rTfml_W_qm_uI26Z</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1270471278</pqid></control><display><type>article</type><title>Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass</title><source>Alma/SFX Local Collection</source><creator>Huang, P.Y. ; Hovden, R. ; Mao, Q. ; Muller, D.A. ; Kurasch, S. ; Kaiser, U. ; Kotakoski, J. ; Krasheninnikov, A. ; Srivastava, A. ; Skakalova, V. ; Smet, J. ; Meyer, J.</creator><creatorcontrib>Huang, P.Y. ; Hovden, R. ; Mao, Q. ; Muller, D.A. ; Kurasch, S. ; Kaiser, U. ; Kotakoski, J. ; Krasheninnikov, A. ; Srivastava, A. ; Skakalova, V. ; Smet, J. ; Meyer, J.</creatorcontrib><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.</description><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927612003558</identifier><identifier>PMID: 23191115</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Applications of Aberration-Corrected STEM and SEM-05 ; Graphene ; Instrumentation Symposium ; Microscopy ; Scholarships & fellowships ; Silica ; Silicon ; Simulation ; Spectrum analysis</subject><ispartof>Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.340-341</ispartof><rights>Copyright © Microscopy Society of America 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782,27913,27914</link.rule.ids></links><search><creatorcontrib>Huang, P.Y.</creatorcontrib><creatorcontrib>Hovden, R.</creatorcontrib><creatorcontrib>Mao, Q.</creatorcontrib><creatorcontrib>Muller, D.A.</creatorcontrib><creatorcontrib>Kurasch, S.</creatorcontrib><creatorcontrib>Kaiser, U.</creatorcontrib><creatorcontrib>Kotakoski, J.</creatorcontrib><creatorcontrib>Krasheninnikov, A.</creatorcontrib><creatorcontrib>Srivastava, A.</creatorcontrib><creatorcontrib>Skakalova, V.</creatorcontrib><creatorcontrib>Smet, J.</creatorcontrib><creatorcontrib>Meyer, J.</creatorcontrib><title>Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><description>Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.</description><subject>Applications of Aberration-Corrected STEM and SEM-05</subject><subject>Graphene</subject><subject>Instrumentation Symposium</subject><subject>Microscopy</subject><subject>Scholarships & fellowships</subject><subject>Silica</subject><subject>Silicon</subject><subject>Simulation</subject><subject>Spectrum analysis</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kFFLwzAQx4MoTqcfwLeAz9VckjbxcUydg4HI9LmkaToy2qYmqbBvb-b2IIgvd8fd7_-_4xC6AXIHBMT9GjiDByoKoISwPJcn6CK18kwC5Kc_NWT7-QRdhrAlCSKiOEcTmmSQmAu0ehtVH21U0X4ZPIuuszrzJrh2jNb1eNmpje03WPU1Xg9GR--CdsMOuwYrTB_x2rZWK7xoVQhX6KxRbTDXxzxFH89P7_OXbPW6WM5nq0yD5DGTVBOpcyEpryrRAAdDCllzUysKJgcuGsm4EowoVTVSyBqKmnFuVM5YTRSbotuD7-Dd52hCLLdu9H1aWQIVhIsUZaLgQOl0c_CmKQdvO-V3JZBy_7_yz_-Shh01qqu8rTfml_W_qm_uI26Z</recordid><startdate>20120701</startdate><enddate>20120701</enddate><creator>Huang, P.Y.</creator><creator>Hovden, R.</creator><creator>Mao, Q.</creator><creator>Muller, D.A.</creator><creator>Kurasch, S.</creator><creator>Kaiser, U.</creator><creator>Kotakoski, J.</creator><creator>Krasheninnikov, A.</creator><creator>Srivastava, A.</creator><creator>Skakalova, V.</creator><creator>Smet, J.</creator><creator>Meyer, J.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>20120701</creationdate><title>Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass</title><author>Huang, P.Y. ; Hovden, R. ; Mao, Q. ; Muller, D.A. ; Kurasch, S. ; Kaiser, U. ; Kotakoski, J. ; Krasheninnikov, A. ; Srivastava, A. ; Skakalova, V. ; Smet, J. ; Meyer, J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c184t-82c08c57824bb7f141e068d4eda21e5147f834a730aabf878d16d344ea533d0a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Applications of Aberration-Corrected STEM and SEM-05</topic><topic>Graphene</topic><topic>Instrumentation Symposium</topic><topic>Microscopy</topic><topic>Scholarships & fellowships</topic><topic>Silica</topic><topic>Silicon</topic><topic>Simulation</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Huang, P.Y.</creatorcontrib><creatorcontrib>Hovden, R.</creatorcontrib><creatorcontrib>Mao, Q.</creatorcontrib><creatorcontrib>Muller, D.A.</creatorcontrib><creatorcontrib>Kurasch, S.</creatorcontrib><creatorcontrib>Kaiser, U.</creatorcontrib><creatorcontrib>Kotakoski, J.</creatorcontrib><creatorcontrib>Krasheninnikov, A.</creatorcontrib><creatorcontrib>Srivastava, A.</creatorcontrib><creatorcontrib>Skakalova, V.</creatorcontrib><creatorcontrib>Smet, J.</creatorcontrib><creatorcontrib>Meyer, J.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing & Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health & Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health & Medical Complete (Alumni)</collection><collection>Nursing & Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health & Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing & Allied Health Premium</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Huang, P.Y.</au><au>Hovden, R.</au><au>Mao, Q.</au><au>Muller, D.A.</au><au>Kurasch, S.</au><au>Kaiser, U.</au><au>Kotakoski, J.</au><au>Krasheninnikov, A.</au><au>Srivastava, A.</au><au>Skakalova, V.</au><au>Smet, J.</au><au>Meyer, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2012-07-01</date><risdate>2012</risdate><volume>18</volume><issue>S2</issue><spage>340</spage><epage>341</epage><pages>340-341</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><abstract>Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.</abstract><cop>New York, USA</cop><pub>Cambridge University Press</pub><pmid>23191115</pmid><doi>10.1017/S1431927612003558</doi><tpages>2</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2012-07, Vol.18 (S2), p.340-341 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_1270471278 |
| source | Alma/SFX Local Collection |
| subjects | Applications of Aberration-Corrected STEM and SEM-05 Graphene Instrumentation Symposium Microscopy Scholarships & fellowships Silica Silicon Simulation Spectrum analysis |
| title | Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T10%3A07%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Quantitative%20Atomic-resolution%20Imaging%20and%20Spectroscopy%20of%20a%202D%20Silica%20Glass&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Huang,%20P.Y.&rft.date=2012-07-01&rft.volume=18&rft.issue=S2&rft.spage=340&rft.epage=341&rft.pages=340-341&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927612003558&rft_dat=%3Cproquest_cross%3E2868060641%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1270471278&rft_id=info:pmid/23191115&rft_cupid=10_1017_S1431927612003558&rfr_iscdi=true |