Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass

Quantitative Atomic-resolution Imaging and Spectroscopy of a 2D Silica Glass

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

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Veröffentlicht in:Microscopy and microanalysis 2012-07, Vol.18 (S2), p.340-341
Hauptverfasser: Huang, P.Y., Hovden, R., Mao, Q., Muller, D.A., Kurasch, S., Kaiser, U., Kotakoski, J., Krasheninnikov, A., Srivastava, A., Skakalova, V., Smet, J., Meyer, J.
Format: Artikel
Sprache:eng
Schlagworte:
Applications of Aberration-Corrected STEM and SEM-05
Graphene
Instrumentation Symposium
Microscopy
Scholarships & fellowships
Silica
Silicon
Simulation
Spectrum analysis
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Beschreibung
Zusammenfassung:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927612003558